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Journal Articles

Adaptive Kriging Method for Uncertainty Quantification of the Photoelectron Sheath and Dust Levitation on the Lunar Surface

Xinpeng Wei, Jianxun Zhao, Xiaoming He, Zhen Hu, Xiaoping Du, Daoru Han
Journal: Journal of Verification, Validation and Uncertainty Quantification
Article Type: Research-Article
J. Verif. Valid. Uncert. March 2021, 6(1): 011006.
Paper No: VVUQ-20-1029
DOI: https://doi.org/10.1115/1.4050073
Published Online: March 9, 2021
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Topics: Dust, Levitation, Photoelectrons, Uncertainty quantification, Errors, Electric potential
Journal Articles

Physics-Based Gaussian Process Method for Predicting Average Product Lifetime in Design Stage

Xinpeng Wei, Daoru Han, Xiaoping Du
Journal: Journal of Computing and Information Science in Engineering
Article Type: Research Papers
J. Comput. Inf. Sci. Eng. August 2021, 21(4): 041006.
Paper No: JCISE-20-1217
DOI: https://doi.org/10.1115/1.4049509
Published Online: February 11, 2021
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Topics: Design, Failure, Physics, Reliability, Stochastic processes, Event history analysis, Statistics, Testing, Errors, Experimental design
Proceedings Papers

Predicting Average Product Lifetime Using Physics-Based Gaussian Process Method in Early Design Stage

Xinpeng Wei, Daoru Han, Xiaoping Du
Proc. ASME. IDETC-CIE2020, Volume 11B: 46th Design Automation Conference (DAC), V11BT11A043, August 17–19, 2020
Paper No: DETC2020-22199
DOI: https://doi.org/10.1115/DETC2020-22199
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Topics: Design, Physics, Testing, Failure, Product reliability, Reliability, Statistics