The light intensity distribution method for inspecting a reflective surface using a diffusing or retroreflective screen has been studied. Analytical derivations show that the angular light intensity in the screen projection is related to the surface curvature. Numerical modeling with light tracing and intensity accumulation is developed to simulate the D-Sight image formed by double reflection off a part surface with a retroreflective screen. The cone angle of a retroreflective screen is characterized experimentally. The numerical modeling is validated with an analytical solution and then tested by comparing the predicted with the photographed D-Sight images of a profiled SMC (sheet molding compound) panel. The characteristics of double reflection and the effects of eye-to-light distance, eye position relative to the light, angular dependence of intensity distribution inside a retroreflected cone, and surface waviness orientation on the image are investigated. The images of typical surface features are predicted.
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November 1999
Research Papers
Analysis and Modeling of Surface Waviness Inspection with Light Reflection, Part 3: Light Intensity Distribution Method
Ching-Chih Lee
Ching-Chih Lee
Corporate Technology Center, GenCorp, Inc., 2990 Gilchrist Road, Akron, Ohio 44305-4489
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Ching-Chih Lee
Corporate Technology Center, GenCorp, Inc., 2990 Gilchrist Road, Akron, Ohio 44305-4489
J. Manuf. Sci. Eng. Nov 1999, 121(4): 793-801 (9 pages)
Published Online: November 1, 1999
Article history
Received:
April 1, 1996
Revised:
February 1, 1999
Online:
January 17, 2008
Citation
Lee, C. (November 1, 1999). "Analysis and Modeling of Surface Waviness Inspection with Light Reflection, Part 3: Light Intensity Distribution Method." ASME. J. Manuf. Sci. Eng. November 1999; 121(4): 793–801. https://doi.org/10.1115/1.2833147
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