... content as observed in all sintered samples. 09 04 2011 12 04 2011 01 09 2011 01 09 2011 scanning electron microscopy thermal barrier coatings titanium compounds X-ray diffraction Young's modulus yttrium compounds zirconium compounds 1 Lange , F. F. , 1982...

... electron microscope (SEM) electron backscatter analysis. Rietveld analysis using X-ray diffraction is presently the only reliable method to quantify the polytypes in the SiC layer. It was found that the SiC layer consists predominantly (82–94%) of the 3C polytype, with minor amounts of the 6H and 8H...

... cost prohibitive alternative of modifying either material or design. The x-ray diffraction based background studies of thermal and mechanical stability of surface enhancement techniques are briefly reviewed, demonstrating the importance of minimizing cold work. The LPB process, tooling, and control...

... electron microscope to observe the microstructure and x-ray diffraction techniques to analyze the phase composition. The results showed different behaviors for the two materials: the zirconia-based coating being rapidly degraded by the vanadium compounds and resistant to attack by the sulfur materials...