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  • Proceedings Article August 02, 2015

    Michael Biskach; Timo Saha; William Zhang; James Mazzarella; Ryan McClelland; Jason Niemeyer; Mark Schofield; Kai Chan

    Proc. ASME. 57113; Volume 4: 20th Design for Manufacturing and the Life Cycle Conference; 9th International Conference on Micro- and Nanosystems, V004T09A021.August 02, 2015
    doi: 10.1115/DETC2015-47893