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  • Proceedings Article January 01, 2007

    Christopher E. Hann; J. Geoffrey Chase; Crispen Berg; Richard G. Brown; Rodney B. Elliott; XiaoQi Chen

    Proc. ASME. 48051; Volume 4: ASME/IEEE International Conference on Mechatronic and Embedded Systems and Applications and the 19th Reliability, Stress Analysis, and Failure Prevention Conference:169-178.January 01, 2007
    DETC2007-34261
    doi: 10.1115/DETC2007-34261

    TOPICS: Cancer